Sukhakarta Technical And Consultancy employs several key methods for analyzing grain size:

• Optical Microscopy: This approach involves examining a prepared sample under a microscope to measure the size of individual grains. By using a calibrated eyepiece reticle or image analysis software, this method offers a relatively quick and cost-effective means of determining grain sizes ranging from a few micrometers to several hundred micrometers.
• Electron Backscatter Diffraction (EBSD): EBSD, which is based on scanning electron microscopy (SEM), provides detailed information on crystallographic features and grain size. It examines the crystal structure and orientation of grains through diffraction patterns generated by electrons interacting with the sample. This technique is particularly useful for analyzing grain sizes in the submicron and nanoscale range.
• X-Ray Diffraction (XRD): X-ray diffraction involves the interaction of X-rays with a material’s crystal lattice to identify its atomic and molecular structure. While primarily used for phase identification and crystallography, XRD can also provide average grain size information based on the broadening of diffraction peaks. However, it is less commonly used for precise grain size analysis compared to other techniques.
• Image Analysis: This method uses digital image analysis tools to measure grain sizes from images captured with various microscopy techniques. The image is segmented into individual grains, and their size distribution is analyzed. This approach is especially useful for examining numerous grains or intricate grain shapes.